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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/936

Title: Failure mechanisms and qualification testing of passive components
Authors: Post, H.A.
Letullier, P.
Briolat, T.
Humke, R.
Schuhmann, R.
Saarinen, K.
Werner, W.
Ousten, Y.
Dehbi, A.
Wondrak, W.
Issue Date: 2005
Citation: Microelectronics Reliability, 45(9-10). p. 1626-1632
Abstract: New electronic architectures and mechatronic integration in automotive and oil-field applications lead to increasing requirements concerning operating temperatures and vibration levels. At the same time, reliability and lifetime have to fulfil strong demands. In the European funded project PROCURE (Program for the development of passive devices used in rough environments) a generic spectrum of passive components needed for electronic control units has been developed. The failure mechanisms, the technological challenges, and the test requirements are highlighted below.
URI: http://hdl.handle.net/1942/936
DOI: 10.1016/j.microrel.2005.07.085
ISI #: 000232253500066
ISSN: 0026-2714
Category: A1
Type: Journal Contribution
Appears in Collections: Research publications

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