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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/8143

Title: Electrical characterisation and reliability studies of thick film gas sensor structures.
Authors: CZECH, Jan
MANCA, Jean
Roggen J
Huyberechts G
STALS, Lambert
DE SCHEPPER, Luc
Issue Date: 1996
Publisher: I E E E
Citation: ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103.
Notes: LIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM.
URI: http://hdl.handle.net/1942/8143
ISI #: A1996BG12J00018
ISBN: 0-7803-2783-7
Type: Proceedings Paper
Appears in Collections: Research publications

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