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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7420

Title: Morphology of MDMO-PPV: PCBM bulk hetero-junction organic solar cells studied by AFM, KFM and TEM
Authors: MARTENS, Tom
BEELEN, Zjef
D'HAEN, Jan
MUNTERS, Tom
GORIS, Ludwig
MANCA, Jean
D'OLIESLAEGER, Marc
VANDERZANDE, Dirk
DE SCHEPPER, Luc
Andriessen, Ronn
Issue Date: 2003
Publisher: SPIE-INT SOCIETY OPTICAL ENGINEERING
Citation: Kafafi, ZH (Ed.) ORGANIC PHOTOVOLTAICS III. p. 40-47.
Series/Report: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), 4801
Abstract: The microstructure of MDMO-PPV:PCBM blends as used in bulk hetero-junction organic solar cells was studied by Atomic Force Microscopy (AFM) and Kelvin Force Microscopy (KFM) to image the surface morphology and by means of Transmission Electron Microscopy (TEM) to reveal images of the film's interior. By introducing KFM, it was possible to demonstrate that phase separated domains have different local electrical properties than the surrounding matrix. Since blend morphology clearly influences global electrical properties and photovoltaic performance, an attempt to control the morphology by means of casting conditions was undertaken. By using AFM, it has been proven that not only the choice of solvent, but also drying conditions dramatically influence the blend structure. Therefore, the possibility of discovering the blend morphology by AFM, KFM and TEM makes them powerful tools for understanding today's organic photovoltaic performances and for screening new sets of materials.
URI: http://hdl.handle.net/1942/7420
ISI #: 000182159100006
ISBN: 0-8194-4569-X
ISSN: 0277-786X
Category: C1
Type: Proceedings Paper
Validation: ecoom, 2004
Appears in Collections: Research publications

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