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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7225

Title: A high resolution method for measuring hot carrier degradation in matched transistor pairs
Authors: DREESEN, Raf
DE CEUNINCK, Ward
DE SCHEPPER, Luc
Groeseneken, G.
Issue Date: 1997
Citation: Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis. p. 1533-1536.
URI: http://hdl.handle.net/1942/7225
Type: Proceedings Paper
Appears in Collections: Research publications

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