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|Title: ||Towards an understanding of ion beam mixing by quantitative internal profiling: Cu in Si|
|Authors: ||Tian, C.|
de Bisschop, P.
|Issue Date: ||1998|
|Publisher: ||Chichester Wiley 1998|
|Citation: ||Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, 7-12 September 1997). p. 351-354.|
|Type: ||Proceedings Paper|
|Appears in Collections: ||Research publications|
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