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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/6236

Title: Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques
Authors: Gregoris, G.
Bouton, F.
de Keukeleire, C.
Siliprandi, P.
Baio, F.
DE SCHEPPER, Luc
DE CEUNINCK, Ward
Tielemans, L.
Ahrens, T.
Krumm, M.
Issue Date: 1995
Citation: Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160.
URI: http://hdl.handle.net/1942/6236
Type: Proceedings Paper
Appears in Collections: Research publications

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