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|Title: ||Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques|
|Authors: ||Gregoris, G.|
de Keukeleire, C.
DE SCHEPPER, Luc
DE CEUNINCK, Ward
|Issue Date: ||1995|
|Citation: ||Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160.|
|Type: ||Proceedings Paper|
|Appears in Collections: ||Research publications|
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