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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/5530

Title: A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradation
Authors: PETERSEN, Rainer
DE CEUNINCK, Ward
DE SCHEPPER, Luc
Muraro, J.-L.
Issue Date: 2000
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Citation: Microelectronics and reliability, 40(8-10). p. 1721-1726
Abstract: Accelerated life testing provides a necessary tool for reliability validation but is generally very time-consuming as standard test take up to 2000 hours to proceed. In this article, results on the early stages of the ageing of pHEMT transistors are presented and it is shown that the necessary test time can be decreased from 2000 hours to 144 hours without loss of data confidence. This has been enabled by the application of an insitu measurement method where the ageing of the device under test is characterized during the stress phase. Two main degradation factors can be identified in good agreement with findings reported in literature. The data have been successfully correlated with standard test results performed on a 2000 hours time scale.
URI: http://hdl.handle.net/1942/5530
DOI: 10.1016/S0026-2714(00)00111-6
ISI #: 000089532800079
ISSN: 0026-2714
Category: A1
Type: Journal Contribution
Validation: ecoom, 2001
Appears in Collections: Research publications

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