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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4289

Title: New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffraction
Authors: MEERT, Bart
QUAEYHAEGENS, Carl
KNUYT, Gilbert
JANSSEN, Herman
STALS, Lambert
Issue Date: 1998
Publisher: 1997
Citation: Proceedings of the 5th International Conference on Residual Stresses. p. 522-527.
URI: http://hdl.handle.net/1942/4289
Type: Proceedings Paper
Appears in Collections: Research publications

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