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|Title: ||Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films|
|Authors: ||Volodin, A.|
Van Haesendonck, C.
|Issue Date: ||2007|
|Publisher: ||WILEY-V C H VERLAG GMBH|
|Citation: ||PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2915-2919|
|Abstract: ||Electrostatic force microscopy (EFM) has been used to probe the conducting properties of the hydrogen-terminated (H-terminated) surface of CVD diamond films. Two parallel electrodes, separated by a distance of 100 mu m, are fabricated on the sample surface. EFM images the voltage distribution over a current-carrying H-terminated diamond film. The almost linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as diffusive conductors with a well-defined value of the sheet resistance. On the other hand, conductive as well as insulating regions are observed to coexist for H-terminated diamond surfaces with poor electric conductivity. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.|
|Notes: ||Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, B-3001 Heverlee, Belgium. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. CEA Saclay, LIST, CEA Rech Technol, DETECS SSTM LTD, F-91191 Gif Sur Yvette, France.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, B-3001 Heverlee, Belgium.Alexander.Volodin@fys.kuleuven.be|
|Link to publication: ||http://doi.wiley.com/10.1002/pssa.200776334|
|ISI #: ||000249648700013|
|Type: ||Journal Contribution|
|Validation: ||ecoom, 2008|
|Appears in Collections: ||Research publications|
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