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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4171

Title: Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films
Authors: Volodin, A.
Toma, C.
BOGDAN, G.
DEFERME, Wim
HAENEN, Ken
NESLADEK, Milos
Van Haesendonck, C.
Issue Date: 2007
Publisher: WILEY-V C H VERLAG GMBH
Citation: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2915-2919
Abstract: Electrostatic force microscopy (EFM) has been used to probe the conducting properties of the hydrogen-terminated (H-terminated) surface of CVD diamond films. Two parallel electrodes, separated by a distance of 100 mu m, are fabricated on the sample surface. EFM images the voltage distribution over a current-carrying H-terminated diamond film. The almost linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as diffusive conductors with a well-defined value of the sheet resistance. On the other hand, conductive as well as insulating regions are observed to coexist for H-terminated diamond surfaces with poor electric conductivity. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Notes: Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, B-3001 Heverlee, Belgium. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. CEA Saclay, LIST, CEA Rech Technol, DETECS SSTM LTD, F-91191 Gif Sur Yvette, France.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, B-3001 Heverlee, Belgium.Alexander.Volodin@fys.kuleuven.be
URI: http://hdl.handle.net/1942/4171
Link to publication: http://doi.wiley.com/10.1002/pssa.200776334
ISI #: 000249648700013
ISSN: 0031-8965
Category: A1
Type: Journal Contribution
Validation: ecoom, 2008
Appears in Collections: Research publications

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