Document Server@UHasselt >
Research publications >
Please use this identifier to cite or link to this item:
|Title: ||Tip voltage controlled local modification of hydrogenated diamond surface with an atomic force microscope|
|Authors: ||Toma, C.|
Van Haesendonck, C.
|Issue Date: ||2007|
|Publisher: ||WILEY-V C H VERLAG GMBH|
|Citation: ||PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2920-2924|
|Abstract: ||The influence of the voltage applied to the tip of an atomic force microscope (AFM) on the local modification of the surface of CVD-grown diamond films is studied. By applying a negative voltage to the conductive (highly doped) silicon AFM tip, two kinds of patterns can be created. In the voltage range -6 V to -10 V structures that are elevated with respect to the surface (creation of bumps) are obtained, while at higher voltages (-12 V to -15 V) the patterns are scribed into the diamond surface (creation of pits). The origin of the observed modifications is discussed in terms of an electrochemical process that is enhanced by local heating occurring due to severe current crowding. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.|
|Notes: ||Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, B-3001 Heverlee, Belgium. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, B-3590 Diepenbeek, Belgium. CEA Saclay, LIST, CEA Rech Technol, DETECS SSTM LTD, F-91191 Gif Sur Yvette, France.Toma, C, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, B-3001 Heverlee, Belgium.Cristina.Toma@fys.kuleuven.be|
|Link to publication: ||http://doi.wiley.com/10.1002/pssa.200776321|
|ISI #: ||000249648700014|
|Type: ||Journal Contribution|
|Validation: ||ecoom, 2008|
|Appears in Collections: ||Research publications|
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.