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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4170

Title: Tip voltage controlled local modification of hydrogenated diamond surface with an atomic force microscope
Authors: Toma, C.
Volodin, A.
BOGDAN, G.
DEFERME, Wim
HAENEN, Ken
NESLADEK, Milos
Van Haesendonck, C.
Issue Date: 2007
Publisher: WILEY-V C H VERLAG GMBH
Citation: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2920-2924
Abstract: The influence of the voltage applied to the tip of an atomic force microscope (AFM) on the local modification of the surface of CVD-grown diamond films is studied. By applying a negative voltage to the conductive (highly doped) silicon AFM tip, two kinds of patterns can be created. In the voltage range -6 V to -10 V structures that are elevated with respect to the surface (creation of bumps) are obtained, while at higher voltages (-12 V to -15 V) the patterns are scribed into the diamond surface (creation of pits). The origin of the observed modifications is discussed in terms of an electrochemical process that is enhanced by local heating occurring due to severe current crowding. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Notes: Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, B-3001 Heverlee, Belgium. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, B-3590 Diepenbeek, Belgium. CEA Saclay, LIST, CEA Rech Technol, DETECS SSTM LTD, F-91191 Gif Sur Yvette, France.Toma, C, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, B-3001 Heverlee, Belgium.Cristina.Toma@fys.kuleuven.be
URI: http://hdl.handle.net/1942/4170
Link to publication: http://doi.wiley.com/10.1002/pssa.200776321
ISI #: 000249648700014
ISSN: 0031-8965
Category: A1
Type: Journal Contribution
Validation: ecoom, 2008
Appears in Collections: Research publications

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