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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4167

Title: Hydrogen bonding at grain surfaces and boundaries of nanodiamond films detected by high resolution electron energy loss spectroscopy
Authors: Michaelson, Sh.
Ternyak, O.
Hoffman, A.
WILLIAMS, Oliver
Gruen, D. M.
Issue Date: 2007
Publisher: AMER INST PHYSICS
Citation: APPLIED PHYSICS LETTERS, 91(10). p. 103104-...
Abstract: Hydrogenated nanodiamond films consisting of 300 and 10-30 nm grain sizes were examined by high resolution electron energy loss spectroscopy. C-H stretching modes were identified at 350, 360, and 375 meV. The mode at 375 meV was enhanced in the case of 10-30 nm grain size and it is stable up to in situ annealing to >>800 degrees C. Complete hydrogen desorption occurs upon annealing to 1000 degrees C. Exposure of the nanodiamond film to atomic hydrogen results in a strong quenching of the 375 meV C-H mode, most likely due to preferential etching of (sp(2))-carbon-hydrogen at the surface and grain boundaries of the films.
Notes: Technion Israel Inst Technol, Schulich Fac Chem, IL-32000 Haifa, Israel. Hasselt Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium. IMEC, Div IMOMEC, B-3590 Diepenbeek, Belgium. Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA.Hoffman, A, Technion Israel Inst Technol, Schulich Fac Chem, IL-32000 Haifa, Israel.choffman@tx.technion.ac.il
URI: http://hdl.handle.net/1942/4167
DOI: 10.1063/1.2779848
ISI #: 000249322900057
ISSN: 0003-6951
Category: A1
Type: Journal Contribution
Validation: ecoom, 2008
Appears in Collections: Research publications

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