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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4148

Title: Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films
Authors: Volodin, A.
Toma, C.
BOGDAN, Anna
DEFERME, Wim
HAENEN, Ken
NESLADEK, Milos
Van Haesendonck, C.
Issue Date: 2007
Publisher: AMER INST PHYSICS
Citation: APPLIED PHYSICS LETTERS, 91(14). p. 142111-...
Abstract: A method for mapping the surface conductivity of hydrogen-terminated (H-terminated) diamond on a sub-100 nm scale is presented. The measuring technique relies on electrostatic force microscopy imaging of the voltage distribution of a current-carrying H-terminated diamond film. The uniform linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as homogeneous, diffusive conductors with a well-defined value of the sheet resistance. On the other hand, we observe conductive as well as insulating regions that coexist for not perfectly H-terminated diamond surfaces with poor electric conductivity. () 2007 American Institute of Physics. (C) 2007 American Institute of Physics.
Notes: Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, BE-3001 Louvain, Belgium. Hasselt Univ, Mat Res Inst, BE-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, BE-3590 Diepenbeek, Belgium.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, BE-3001 Louvain, Belgium.alexander.volodin@fys.kuleuven.be
URI: http://hdl.handle.net/1942/4148
DOI: 10.1063/1.2795342
ISI #: 000249974100057
ISSN: 0003-6951
Category: A1
Type: Journal Contribution
Validation: ecoom, 2008
Appears in Collections: Research publications

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