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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3728

Title: ELECTRIC-FIELD RELAXATION IN PROLONGED-TIME PHOTOCURRENT EXPERIMENTS
Authors: SCHAUER, F
BRADA, P
Adriaenssens, G.J.
NESLADEK, Milos
STALS, Lambert
Issue Date: 1993
Publisher: ELSEVIER SCIENCE BV
Citation: JOURNAL OF NON-CRYSTALLINE SOLIDS, 166. p. 505-508
Abstract: The influence of the progressive electric field relaxation on the transient photocurrent for intrinsic and B-doped a-Si:H samples is investigated. The photocurrent measurements are compared with the voltage sweep-out experiments and with mathematical simulations of the photocurrent obtained from the numerical solution of the multiple trapping model. Beyond the dielectric relaxation a current due to the charge release from deep traps is identified.
Notes: TECH ACAD BRNO,DEPT PHYS,CS-60200 BRNO,CZECH REPUBLIC.NESLADEK, M, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,CAMPUSLAAN,B-3590 DIEPENBEEK,BELGIUM.
URI: http://hdl.handle.net/1942/3728
ISI #: A1993MT01200123
ISSN: 0022-3093
Type: Journal Contribution
Appears in Collections: Research publications

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