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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3377

Title: Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques
Authors: Gregoris, G.
Bouton, F.
DeKeukeleire, C.
Siliprandi, P.
Baio, F.
De Schepper, Luc
De Ceuninck, Ward
Tielemans, L.
Ahrens, T.
Krumm, M.
Issue Date: 1996
Publisher: JOHN WILEY & SONS LTD
Citation: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 12(4). p. 247-252
Abstract: We present the results of SHORTEST, a BRITE EURAM II project for the introduction in industry of an advanced approach to the reliability evaluation of electronic assemblies. The achievements so far are the development and validation of seven in-situ test techniques. Five of the test techniques demonstrate the capability of detecting failure mechanisms at 48 hours with moderate stress conditions, and half of the in-situ test results obtained at 48 hours on 10 subtechnologies correlate with conventional tests. All correlation results are presented. The application of the method for quality assurance and building-in reliability is discussed. The final aim of SHORTEST is to look for the exploitation of the developed in-situ techniques. The marketing study that will define the industrial needs of European companies is presented. In parallel, the insertion in the CECC specification of recommendations based on the SHORTEST principle is foreseen.
Notes: IBM CORP,EUROPEAN PACKAGING APPLICAT CTR,I-20059 VIMERCATE,ITALY. IMO LUC,B-3590 DIEPENBEEK,BELGIUM. DESTIN NV,B-3590 DIEPENBEEK,BELGIUM. UNIV BOURGOGNE,F-21004 DIJON,FRANCE. CEM,NEUMUNSTER,GERMANY.Gregoris, G, ALCATEL ESPACE,26 AV JF CHAMPOLL,BP 1187,F-31037 TOULOUSE,FRANCE.
URI: http://hdl.handle.net/1942/3377
Link to publication: http://www3.interscience.wiley.com/cgi-bin/abstract/20147/ABSTRACT
ISI #: A1996VK02400006
ISSN: 0748-8017
Type: Journal Contribution
Appears in Collections: Research publications

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