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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3232

Title: Optical properties of microcrystalline materials
Authors: Vanecek, M
Poruba, A
REMES, Zdenek
Beck, N.
Issue Date: 1998
Citation: JOURNAL OF NON-CRYSTALLINE SOLIDS, 230. p. 967-972
Abstract: We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (mu c-Si) thin films and diamond layers. Enhanced light absorption in mu c-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, alpha, smaller than 0.1 cm(-1) at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency mu c-Si solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed. (C) 1998 Elsevier Science B.V. All rights reserved.
Notes: Acad Sci Czech Republ, Inst Phys, CZ-16200 Praha 6, Czech Republic. Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland. Limburgs Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Praha 6, Czech Republic.vanecek@fzu.cz
URI: http://hdl.handle.net/1942/3232
DOI: 10.1016/S0022-3093(98)00202-6
ISI #: 000074599000062
ISSN: 0022-3093
Type: Journal Contribution
Validation: ecoom, 1999
Appears in Collections: Research publications

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