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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3195

Title: Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements
Authors: MANCA, Jean
CROES, Kristof
DE SCHEPPER, Luc
DE CEUNINCK, Ward
STALS, Lambert
Jacques, L
Tielemans, L
Gerrits, N
Hoppener, R
Issue Date: 1998
Publisher: JOHN WILEY & SONS LTD
Citation: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68
Abstract: The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps, Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. (C) 1998 John Wiley & Sons, Ltd.
Notes: Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. Philips Components Ind, B-8800 Roeselare, Belgium. DESTIN NV, B-3590 Diepenbeek, Belgium. DSM Solutech, NL-6422 PN Heerlen, Netherlands.Manca, JV, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.
URI: http://hdl.handle.net/1942/3195
DOI: 10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P
ISI #: 000073717800002
ISSN: 0748-8017
Type: Journal Contribution
Validation: ecoom, 1999
Appears in Collections: Research publications

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