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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2905

Title: Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films
Authors: Flueraru, C
Schrader, S
Zauls, V
Motschmann, H
Stiller, B
Issue Date: 2000
Citation: SYNTHETIC METALS, 111. p. 603-606
Abstract: We have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved.
Notes: Max Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany.
URI: http://hdl.handle.net/1942/2905
DOI: 10.1016/S0379-6779(99)00318-5
ISI #: 000087496300137
ISSN: 0379-6779
Category: A1
Type: Journal Contribution
Validation: ecoom, 2001
Appears in Collections: Research publications

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