Document Server@UHasselt >
Research >
Research publications >

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/26296

Title: Nanoscale investigation of enhanced electron field emission for silver ion implanted/post-annealed ultrananocrystalline diamond films
Authors: Panda, Kalpataru
Hyeok, Jeong Jin
Park, Jeong Young
Kamatchi Jothiramalingam, Sankaran
Balakrishnan, Sundaravel
Lin, I. -Nan
Issue Date: 2017
Citation: SCIENTIFIC REPORTS, 7 (Art N° 16325)
Abstract: Silver (Ag) ions are implanted in ultrananocrystalline diamond (UNCD) films to enhance the electron field emission (EFE) properties, resulting in low turn-on field of 8.5 V/mu m with high EFE current density of 6.2 mA/cm(2) (at an applied field of 20.5 V/mu m). Detailed nanoscale investigation by atomic force microscopy based peak force-controlled tunneling atomic force microscopy (PF-TUNA) and ultra-high vacuum scanning tunneling microscopy (STM) based current imaging tunneling spectroscopy (CITS) reveal that the UNCD grain boundaries are the preferred electron emission sites. The two scanning probe microscopic results supplement each other well. However, the PF-TUNA measurement is found to be better for explaining the local electron emission behavior than the STM-based CITS technique. The formation of Ag nanoparticles induced abundant sp(2) nanographitic phases along the grain boundaries facilitate the easy transport of electrons and is believed to be a prime factor in enhancing the conductivity/EFE properties of UNCD films. The nanoscale understanding on the origin of electron emission sites in Ag-ion implanted/annealed UNCD films using the scanning probe microscopic techniques will certainly help in developing high-brightness electron sources for flat-panel displays applications.
Notes: [Panda, Kalpataru; Park, Jeong Young] Inst for Basic Sci Korea, Ctr Nanomat & Chem React, Daejeon 34141, South Korea. [Hyeok, Jeong Jin; Park, Jeong Young] Korea Adv Inst Sci & Technol, Grad Sch EEWS, Daejeon 34141, South Korea. [Sankaran, Kamatchi Jothiramalingam] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Sankaran, Kamatchi Jothiramalingam] IMEC VZW, IMOMEC, Diepenbeek, Belgium. [Balakrishnan, Sundaravel] Indira Gandhi Ctr Atom Res, Mat Phys Div, Kalpakkam 603102, Tamil Nadu, India. [Lin, I. -Nan] Tamkang Univ, Dept Phys, Tamsui 251, Taiwan.
URI: http://hdl.handle.net/1942/26296
DOI: 10.1038/s41598-017-16395-1
ISI #: 000416137700013
ISSN: 2045-2322
Category: A1
Type: Journal Contribution
Appears in Collections: Research publications

Files in This Item:

Description SizeFormat
Published version4.7 MBAdobe PDF

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.