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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2526

Title: Fourier-transform photocurrent spectroscopy of defects in CVD diamond layers
Authors: Kravets, R
Ogorodniks, V
Poruba, A
Moravec, P
NESLADEK, Milos
Rosa, J
Vanecek, M
Issue Date: 2002
Publisher: WILEY-V C H VERLAG GMBH
Citation: PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 193(3). p. 502-507
Abstract: Fourier-transform photocurrent spectroscopy has been used for the first time to study defects in nominally undoped CVD diamond layers. The hydrogenated surface of diamond ("as grown" or post-hydrogenated) has been annealed in air and changes in surface conductivity and photoconductivity have been monitored as a function of temperature and time. The reduction of surface conductivity with annealing led to an enhancement of photosensitivity and enabled us to study the spectral distribution of the photoionization cross section of shallow and deep defects in the gap over several orders of magnitude in the temperature range of 77-400 K. The photo-Hall effect was used for the determination of the sign of photogenerated carriers. An anomalous temperature dependence of the acceptor defect level was detected. A residual boron contamination was observed in one layer.
Notes: Acad Sci Czech Republ, Inst Phys, CR-16200 Prague 6, Czech Republic. Charles Univ, Inst Phys, CR-12116 Prague, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CR-16200 Prague 6, Czech Republic.
URI: http://hdl.handle.net/1942/2526
DOI: 10.1002/1521-396X(200210)193:3<502::AID-PSSA502>3.0.CO;2-4
ISI #: 000179076900019
ISSN: 0031-8965
Category: A1
Type: Journal Contribution
Validation: ecoom, 2003
Appears in Collections: Research publications

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