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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/25159

Title: Proposing a model to investigate the impact of interconnectiontechnology on shading damage by TFPV modules
Authors: Carolus, Jorne
Van De Sande, Wieland
Vandenbergh, Thomas
Bakker, Klaas
Meuris, Marc
Daenen, Michaël
Issue Date: 2017
Citation: 9th edition Sunday 2017, Bussum - The Netherlands, 8/10/2017
Abstract: Recent studies show that thin film photovoltaics (TFPV) are prone to shading damage. When one cell in a TFPV module is shaded, the other cells connected in series will push the current in reverse through the shaded cell. This creates hot spots and eventually breakdown when the power of the other cells in series connected is sufficient. In this poster, we present a model which can be used to determine the impact of interconnection technology on shading damage by TFPV modules.
URI: http://hdl.handle.net/1942/25159
Category: C2
Type: Conference Material
Appears in Collections: Research publications

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