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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/25158

Title: Impact of potential-induced degradation (PID) on PV parameters
Authors: Carolus, Jorne
Govaerts, Jonathan
Voroshazi, Eszter
De Ceuninck, Ward
Daenen, Michaël
Issue Date: 2017
Citation: 9th edition Sunday 2017, Bussum - The Netherlands, 8/10/2017
Abstract: Potential-induced degradation (PID) is known as a severe degradation phenomenon. PID was first noticed in large photovoltaic (PV) plants where a significant amount of PV modules was connected in series, hence resulting in a significant voltage between the solar cells at one end of the string and the grounded frame. According to Naumann et al., the induced electrical field causes a leakage current and sodium ion (Na+) diffusion into stacking faults through the PN-junction of the solar cell, resulting in a substantial lowering of the shunt resistance.
URI: http://hdl.handle.net/1942/25158
Category: C2
Type: Conference Material
Appears in Collections: Research publications

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