Document Server@UHasselt >
Research >
Research publications >

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/24990

Title: Optical Analysis of Planar Multicrystalline Perovskite Solar Cells
Authors: van Eerden, Maarten
Jaysankar, Manoj
Hadipour, Afshin
Merckx, Tamara
Schermer, John J.
Aernouts, Tom
Poortmans, Jef
Paetzold, Ulrich W.
Issue Date: 2017
Citation: ADVANCED OPTICAL MATERIALS, 5(18), p. 1-10 (Art N° 1700151)
Abstract: Organometal halide perovskites are attracting strong interest as light-harvesting absorber materials in single- and multijunction solar cells. In order to advance the technology, careful optical design of the device architecture and elaborate analysis of optical losses are essential. In this work, a detailed optical analysis of semitransparent and opaque planar CH3NH3PbI3 solar cells is reported. Using a combination of variable-angle spectroscopic ellipsometry and spectrophotometry data, the complex refractive indices of all involved materials in the device architecture are accurately determined, taking the underlying layer stack explicitly into account. The optical properties of partial and complete layer stacks of solar cells, comprising CH3NH3PbI3 films with different CH3NH3PbI3 surface topography roughnesses, are simulated using the transfer-matrix method. Very good agreement between simulated and experimental data is demonstrated. Sub-bandgap absorption is observed in CH3NH3PbI3 layer stacks, which is by means of a ray-tracing model shown to be related to diffuse scattering at the multicrystalline CH3NH3PbI3/air interface. Finally, the optical losses of all layers are discriminated for opaque and semitransparent CH3NH3PbI3 solar cells and four-terminal perovskite/Si tandem solar cells.
Notes: [van Eerden, Maarten; Schermer, John J.] Radboud Univ Nijmegen, Fac Sci, Dept Appl Mat Sci, Heyendaalseweg 135, NL-6525 AJ Nijmegen, Netherlands. [van Eerden, Maarten; Jaysankar, Manoj; Hadipour, Afshin; Merckx, Tamara; Aernouts, Tom; Poortmans, Jef; Paetzold, Ulrich W.] IMEC Partner Solliance, Thin Film Photovolta, Kapeldreef 75, B-3001 Heverlee, Belgium. [Poortmans, Jef] Univ Hasselt, Dept Mat Engn, B-3500 Hasselt, Belgium. [Paetzold, Ulrich W.] Karlsruher Inst Technol, Inst Mikrostrukturtech, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany.
URI: http://hdl.handle.net/1942/24990
DOI: 10.1002/adom.201700151
ISI #: 000410805600002
ISSN: 2195-1071
Category: A1
Type: Journal Contribution
Appears in Collections: Research publications

Files in This Item:

Description SizeFormat
Published version2.19 MBAdobe PDF

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.