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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/24410

Title: Effect of Sn/Zn/Cu precursor stack thickness on two-step processed kesterite solar cells
Authors: Ranjbar, Samaneh
Brammertz, Guy
Vermang, Bart
Hadipour, Afshin
Sylvester, M.
Mule, Aniket
Meuris, Marc
da Cunha, A. F.
Poortmans, Jef
Issue Date: 2017
Citation: THIN SOLID FILMS, 633(SI), p. 127-130
Abstract: We have fabricated Cu2ZnSnSe4 (CZTSe) solar cells with different absorber layer thickness. Absorber layers with different thicknesses were fabricated by changing the thickness of e-beam evaporated Sn/Zn/Cu precursor stacks and then selenization in a rapid thermal processing system. Scanning electron microscopy revealed that by increasing the thickness the morphology of CZTSe films improves substantially and energy dispersive spectrometry measurements showed that the Cu to Sn ratio increased with increasing the film thickness, despite a similar Cu to Sn ratio in the starting layers. A longer minority carrier lifetime and higher open circuit voltage were achieved for solar cells with thicker absorber layers. A maximum conversion efficiency of 7.8% (without anti reflection coating) was achieved for a solar cell with 1.7 mu m thickness in which a low doping density of the order of 10(15) cm(-3) was measured, leading to a wide space charge region of about 300 nm. (C) 2016 Elsevier B.V. All rights reserved.
Notes: [Ranjbar, Samaneh; da Cunha, A. F.] Univ Aveiro, Dept Fis I3N, Campus Univ Santiago, P-3810193 Aveiro, Portugal. [Brammertz, Guy; Sylvester, M.; Meuris, Marc] IMEC, Div IMOMEC, Partner Solliance, Wetenschapspk 1, B-3590 Diepenbeek, Belgium. [Brammertz, Guy; Meuris, Marc; Poortmans, Jef] Hasselt Univ, Inst Mat Res IMO, Wetenschapspk 1, B-3590 Diepenbeek, Belgium. [Ranjbar, Samaneh; Vermang, Bart; Hadipour, Afshin; Sylvester, M.; Mule, Aniket; Poortmans, Jef] IMEC, Partner Solliance, Kapeldreef 75, B-3001 Leuven, Belgium. [Ranjbar, Samaneh; Vermang, Bart; Sylvester, M.; Mule, Aniket; Poortmans, Jef] Katholieke Univ Leuven, Dept Elect Engn ESAT, Kasteelpk Arenberg 10, B-3001 Heverlee, Belgium. [Mule, Aniket] ETH, LEEK, Dept Mech & Proc Engn D MAVT, Leonhardstr 21, CH-8092 Zurich, Switzerland.
URI: http://hdl.handle.net/1942/24410
DOI: 10.1016/j.tsf.2016.09.040
ISI #: 000404802300025
ISSN: 0040-6090
Category: A1
Type: Journal Contribution
Appears in Collections: Research publications

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