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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2402

Title: On the atomistic details of electromigration-induced drift
Authors: Proost, J
Jin, M
Verlinden, B
Issue Date: 2004
Citation: SCRIPTA MATERIALIA, 50(2). p. 267-271
Abstract: Electromigration drift studies have been performed inside a SEM. Based on the observed drift mode, a grain boundary grooving model is proposed to account for the atomistic details of current-induced motion. The role of grain boundary structure in determining the local direction of groove propagation is illustrated. (C) 2003 Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
Notes: Dept Met & Mat Engn, B-3001 Louvain, Belgium. IMOMEC, B-3590 Diepenbeek, Belgium.Proost, J, Dept Met & Mat Engn, Kasteelpk Arenberg 44, B-3001 Louvain, Belgium.
URI: http://hdl.handle.net/1942/2402
DOI: 10.1016/j.scriptamat.2003.10.005
ISI #: 000186377200016
ISSN: 1359-6462
Category: A1
Type: Journal Contribution
Validation: ecoom, 2004
Appears in Collections: Research publications

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