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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/24007

Title: Radiation dosimetry properties of smartphone CMOS sensors
Authors: Van Hoey, Olivier
Salavrakos, Alexia
Marques, Antonio
Nagao, Alexandre
Willems, Ruben
Vanhavere, Filip
Cauwels, Vanessa
Nascimento, Luana F.
Issue Date: 2016
Citation: RADIATION PROTECTION DOSIMETRY, 168(3), p. 314-321
Abstract: During the past years, several smartphone applications have been developed for radiation detection. These applications measure radiation using the smartphone camera complementary metal-oxide-semiconductor sensor. They are potentially useful for data collection and personal dose assessment in case of a radiological incident. However, it is important to assess these applications. Six applications were tested by means of irradiations with calibrated X-ray and gamma sources. It was shown that the measurement stabilises only after at least 10-25 min. All applications exhibited a flat dose rate response in the studied ambient dose equivalent range from 2 to 1000 mu Sv h(-1). Most applications significantly over- or underestimate the dose rate or are not calibrated in terms of dose rate. A considerable energy dependence was observed below 100 keV but not for the higher energy range more relevant for incident scenarios. Photon impact angle variation gave a measured signal variation of only about 10 %.
URI: http://hdl.handle.net/1942/24007
DOI: 10.1093/rpd/ncv352
ISI #: 000371608200003
ISSN: 0144-8420
Category: A1
Type: Journal Contribution
Validation: ecoom, 2017
Appears in Collections: Research publications

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