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|Title: ||Radiation dosimetry properties of smartphone CMOS sensors|
|Authors: ||Van Hoey, Olivier|
Nascimento, Luana F.
|Issue Date: ||2016|
|Citation: ||RADIATION PROTECTION DOSIMETRY, 168(3), p. 314-321|
|Abstract: ||During the past years, several smartphone applications have been developed for radiation detection. These applications measure radiation using the smartphone camera complementary metal-oxide-semiconductor sensor. They are potentially useful for data collection and personal dose assessment in case of a radiological incident. However, it is important to assess these applications. Six applications were tested by means of irradiations with calibrated X-ray and gamma sources. It was shown that the measurement stabilises only after at least 10-25 min. All applications exhibited a flat dose rate response in the studied ambient dose equivalent range from 2 to 1000 mu Sv h(-1). Most applications significantly over- or underestimate the dose rate or are not calibrated in terms of dose rate. A considerable energy dependence was observed below 100 keV but not for the higher energy range more relevant for incident scenarios. Photon impact angle variation gave a measured signal variation of only about 10 %.|
|ISI #: ||000371608200003|
|Type: ||Journal Contribution|
|Validation: ||ecoom, 2017|
|Appears in Collections: ||Research publications|
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|Published version||486.17 kB||Adobe PDF|
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