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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/23465

Title: Potential-induced degradation (PID); A test campaign at module level
Authors: Carolus, Jorne
Daenen, Michaël
Issue Date: 2016
Citation: Sunday 2016, Veldhoven - Nederland, 23/11/2016
Abstract: Potential-induced degradation (PID) of photovoltaic (PV) modules may occur when high potential differences between the solar cell and the grounded frame are present. According to Naumann et al., the induced electrical field causes a leakage current and sodium ion (Na+) diffusion into stacking faults through the PN-junction of the solar cell, resulting in a substantial lowering of the shunt resistance.
URI: http://hdl.handle.net/1942/23465
Category: C2
Type: Conference Material
Appears in Collections: Research publications

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