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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/23327

Title: Irreversible damage at high levels of potential-induced degradation on photovoltaic modules
Authors: Carolus, Jorne
De Ceuninck, Ward
Daenen, Michaël
Issue Date: 2017
Publisher: IEEE
Citation: IRPS'17: Proceedings of 55th IEEE International Reliability Physics Symposium, 2017, IEEE,
Series/Report: International Reliability Physics Symposium
Abstract: Potential-induced degradation (PID) of photovoltaic (PV) modules gets a lot of attention since 2010 when Solon published their findings about a degradation mechanism in their PV modules caused by high potential differences between the solar cell and the grounded frame. Module level efficiency drops of 30% and more caused by PID have been reported. A stress test for PID according to IEC 62804 and a recovery test in the same conditions were conducted on a set of 49 commercially available PV modules. In this paper we report the irreversibility of highly affected (i.e. over 85% PID) PV modules. From this point of view, it is important to detect and recover PID before the point of no return. Furthermore, the impact of PID on the different parameters of a PV module and their relevance in order to detect PID in the field are reported.
Notes: Carolus, J (reprint author), Hasselt Univ, Martelarenlaan 42, B-3500 Hasselt, Belgium. jorne.carolus@uhasselt.be
URI: http://hdl.handle.net/1942/23327
DOI: 10.1109/IRPS.2017.7936275
ISI #: 000416068500023
ISBN: 9781509066414
ISSN: 1541-7026
Category: C1
Type: Proceedings Paper
Validation: ecoom, 2018
Appears in Collections: Research publications

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