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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2329

Title: Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond
Authors: Vanecek, M
Kravets, R
Poruba, A
Rosa, J
Koizumi, S
Issue Date: 2003
Citation: DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525
Abstract: Fourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
Notes: Acad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic.
URI: http://hdl.handle.net/1942/2329
DOI: 10.1016/S0925-9635(02)00347-3
ISI #: 000182872000056
ISSN: 0925-9635
Category: A1
Type: Journal Contribution
Validation: ecoom, 2004
Appears in Collections: Research publications

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