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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2106

Title: Pitfalls and their remedies in time-resolved fluorescence spectroscopy and microscopy
Authors: VAN DE VEN, Martin
Valeur, B
Boens, N
Issue Date: 2005
Citation: JOURNAL OF FLUORESCENCE, 15(3). p. 377-413
Abstract: Time-resolved fluorescence spectroscopy and microscopy in both time and frequency domains provide very useful and accurate information on dynamic processes. Good quality data are essential in obtaining reliable parameter estimates. Distortions of the fluorescence response due to artifacts may have disastrous consequences. We provide here a concise overview of potential difficulties encountered under daily laboratory circumstances in the use of time- and frequency-domain equipment as well as practical remedies against common error conditions, elucidated with several graphs to aid the researcher in visual inspection and quality-control of collected data. A range of artifacts due to sample preparation or to optical and electronic pitfalls are discussed, as are remedies against them. Also recommended data analysis strategies are described.
Notes: Katholieke Univ Leuven, Dept Chem, B-3001 Heverlee, Belgium. Transnatl Univ Limburg, Biomed Onderzoeksinst, Limburgs Univ Ctr, Sch Life Sci, B-3590 Diepenbeek, Belgium. Conservatoire Natl Arts & Metiers, CNRS, UMR 8531, Lab Chim Gen, F-75141 Paris, France. ENS Cachan, CNRS, UMR 8531, Lab PPSM, F-94235 Cachan, France.Boens, N, Katholieke Univ Leuven, Dept Chem, Celestijnenlaan 200 F, B-3001 Heverlee, Belgium.noel.boens@chem.kuleuven.be
URI: http://hdl.handle.net/1942/2106
DOI: 10.1007/s10895-005-2632-1
ISI #: 000230175600014
ISSN: 1053-0509
Category: A1
Type: Journal Contribution
Validation: ecoom, 2006
Appears in Collections: Research publications

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