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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/18843

Title: Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment
Authors: Zaghi, Armin E.
Buffiere, Marie
Koo, Jaseok
BRAMMERTZ, Guy
Batuk, Maria
Verbist, Christophe
Hadermann, Joke
Kim, Woo Young
MEURIS, Marc
POORTMANS, Jef
Vleugels, Jef
Issue Date: 2015
Publisher: ELSEVIER SCIENCE SA
Citation: THIN SOLID FILMS, 582, p. 11-17
Abstract: Polycrystalline CuInSe2 semiconductors are efficient light absorber materials for thin film solar cell technology, whereas printing is one of the promising low cost and non-vacuum approaches for the fabrication of thin film solar cells. The printed precursors are transformed into a dense polycrystalline CuInSe2 semiconductor film via thermal treatment in ambient selenium atmosphere (selenization). In this study, the effect of the selenium content in high purity mechanically synthesized CuInSex (x= 2, 1.5, 1 or 0.5) alloy precursors on the recrystallization of the CuInSe2 phase during the selenization process was investigated. The nanostructure and phase variation of CuInSex nanopowders were investigated by different characterization techniques. The recrystallization process of the 1-2 mu m thick CuInSex coatings into the CuInSe2 phase during selenization in selenium vapor was investigated via in-situ high temperature X-ray diffraction. The CuInSex precursors with lower selenium content showed a more pronounced phase conversion into CuInSe2 compared to the higher selenium content CuInSex precursors. Moreover, the CuInSex (x= 0.5 and 1) precursor resulted in a denser polycrystalline CuInSe2 semiconductor film with larger crystals. This could be attributed to a more intensive atomic interdiffusion within the CuInSex precursor system compared to a CuInSe2 phase precursor, and the formation of intermediate CuSe and CuSe2 fluxing phases during selenization. (C) 2014 Elsevier B.V. All rights reserved.
Notes: [Zaghi, Armin E.; Vleugels, Jef] Katholieke Univ Leuven, Dept Mat Engn, B-3001 Heverlee, Belgium. [Buffiere, Marie; Poortmans, Jef] Katholieke Univ Leuven, Dept Elect Engn ESAT, B-3001 Heverlee, Belgium. [Zaghi, Armin E.; Buffiere, Marie; Poortmans, Jef] Imec Partner Solliance, B-3001 Heverlee, Belgium. [Koo, Jaseok; Kim, Woo Young] Yeungnam Univ, Sch Chem Engn, Gyongsan 712749, Gyeongbuk, South Korea. [Batuk, Maria; Verbist, Christophe; Hadermann, Joke] Univ Antwerp, Electon Microscopy Mat Sci EMAT, B-2020 Antwerp, Belgium. [Brammertz, Guy; Meuris, Marc] Imec Div IMOMEC Partner Solliance, B-3590 Diepenbeek, Belgium. [Brammertz, Guy; Meuris, Marc; Poortmans, Jef] Hasselt Univ, Inst Mat Res IMO, Diepenbeek, Belgium. [Zaghi, Armin E.; Buffiere, Marie] SIM Vzw, B-9052 Zwijnaarde, Belgium.
URI: http://hdl.handle.net/1942/18843
DOI: 10.1016/j.tsf.2014.10.003
ISI #: 000352225900004
ISSN: 0040-6090
Category: A1
Type: Journal Contribution
Validation: ecoom, 2016
Appears in Collections: Research publications

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