www.uhasselt.be
DSpace

Document Server@UHasselt >
Research >
Research publications >

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/1585

Title: Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy
Authors: DOUHERET, Olivier
LUTSEN, Laurence
SWINNEN, Ann
BRESELGE, Martin
VANDEWAL, Koen
GORIS, Ludwig
MANCA, Jean
Issue Date: 2006
Publisher: American Institute of Physics
Citation: APPLIED PHYSICS LETTERS, 89(3). p. 032107-...
Abstract: Conductive atomic force microscopy (CAFM) is introduced to perform electrical characterization of organic photovoltaic blends with high spatial resolution. Reference blends used in organic bulk heterojunction solar cells are investigated. The ability of CAFM to electrically evidence phase separated donor and acceptor regions is demonstrated. Furthermore, local spectroscopy is performed to analyze charge transport mechanisms in the blends. Significant modifications of the electrical properties of the semiconducting polymers are shown to occur after blending with fullerene derivatives. Finally, the sensitivity of CAFM to photoelectrical phenomena is revealed. Current variations of few picoamperes are locally observed under illumination of P3HT
URI: http://hdl.handle.net/1942/1585
DOI: 10.1063/1.2227846
ISI #: 000239174100058
ISSN: 0003-6951
Category: A1
Type: Journal Contribution
Validation: ecoom, 2007
Appears in Collections: Research publications

Files in This Item:

There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.