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|Title: ||Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy|
|Authors: ||DOUHERET, Olivier|
|Issue Date: ||2006|
|Publisher: ||American Institute of Physics|
|Citation: ||APPLIED PHYSICS LETTERS, 89(3). p. 032107-...|
|Abstract: ||Conductive atomic force microscopy (CAFM) is introduced to perform electrical characterization of organic photovoltaic blends with high spatial resolution. Reference blends used in organic bulk heterojunction solar cells are investigated. The ability of CAFM to electrically evidence phase separated donor and acceptor regions is demonstrated. Furthermore, local spectroscopy is performed to analyze charge transport mechanisms in the blends. Significant modifications of the electrical properties of the semiconducting polymers are shown to occur after blending with fullerene derivatives. Finally, the sensitivity of CAFM to photoelectrical phenomena is revealed. Current variations of few picoamperes are locally observed under illumination of P3HT|
|ISI #: ||000239174100058|
|Type: ||Journal Contribution|
|Validation: ||ecoom, 2007|
|Appears in Collections: ||Research publications|
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