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Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/14706

Title: Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
Authors: Valev, V.K.
De Clercq, B.
Zheng, X.
Biris, C.G.
Panoiu, N.C.
Silhanek, A.V.
Volskiy, V.
Aktsipetrov, Oleg A.
Vandenbosch, G.A.E.
Ameloot, M.
Moshchalkov, V.V.
Verbiest, T.
Issue Date: 2012
Citation: Andrews, David L.; Nunzi, Jean-Michel; Ostendorf, Andreas (Ed.). Proceedings of SPIE (Nanophotonics IV), p. (ART N° 842411)
Series/Report: Proceedings of SPIE
Series/Report no.: 8424
Abstract: Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.
URI: http://hdl.handle.net/1942/14706
DOI: 10.1117/12.922880
ISI #: 000305699700017
ISBN: 9780819491169
ISSN: 0277-786X
Category: C1
Type: Proceedings Paper
Validation: ecoom, 2014
Appears in Collections: Research publications

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